The IEC 60529 IP2X Jointed Test Finger Probe can meet the requirements of IEC61032 standard.
The IEC 60529 IP2X Jointed Test Finger Probe is intended to verify the basic protection against access to hazardous parts. It’s also used to verify the protection against access with a finger.
This is the “international” test probe B required by most IEC, EN and CSA standards, in addition to many UL standards. The Jointed Finger Test is a high-precision probe built in exact accordance with IEC standards such as IEC 60950, IEC 61010, and IEC 61032 and is also used for CSA and UL standards.
Test sample: Easily accessible enclosure live parts or mechanical parts.
This test finger probe consists of dito, finger, base and insulated handle which simulates the characteristics of the human hand. It has two movable joints, which can be curved at 90°. Customizable: it can be used for anti-electric shock test when equipped with pluggable banana plugs and amphenol connector at the end of the handle , or used for enclosure protection test when open threaded hole of M6 at the end of the handle (connected with pull and push dynamometer).
Both joints shall permit movement in the same plane and the same direction through an angle of 90o with a 0o to +10o.
|Name||Standard Test Finger With Force|
|Fingertip to baffle||180mm|
|Fingertip cutting bevel angle||37 degree|
|Fingertip taper||14 degree|
|Test finger diameter||12mm|
|A-A Section diameter||50mm|
|A-A Section width||20mm|
|Force||With force of 10N, 20N,30N|
|Applied standard||IEC 60529-1|