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IEC 62368-1:2018 clause 5.3.2, 5.4.10, V.1.4 and figure V.3 Blunt Test Probe SC-I23

IEC 62368-1:2018 clause 5.3.2, 5.4.10, V.1.4 and figure V.3 Blunt Test Probe SC-I23

IEC 62368-1:2018 clause 5.3.2, 5.4.10, V.1.4 and figure V.3 Blunt Test Probe SC-I23

Product information:

The blunt probe of figure V.3 conforms to IEC 62368-1:2018 clause 5.3.2, 5.4.10, V.1.4 and figure V.3, IEC60950 figure 2C, IEC60065 figure B1, IEC62151 figure 3 and UL6500 figure B.1.

It is used for the bare parts of TNV circuits of information technology equipment to see whether they have sufficient protection.

 

Technical Parameters:

Probe Length 80 mm
Probe End Radius R6 mm
Probe Diameter Φ12 mm
Baffle Diameter of Handle Φ 50 mm
Probe material Stainless steel
Handle material Nylon

 

IEC 62368-1:2018 clause 5.3.2, 5.4.10, V.1.4 and figure V.3 Blunt Test Probe SC-I23
IEC 62368-1:2018 clause 5.3.2, 5.4.10, V.1.4 and figure V.3 Blunt Test Probe SC-I23
IEC 62368-1:2018 clause 5.3.2, 5.4.10, V.1.4 and figure V.3 Blunt Test Probe SC-I23
IEC 62368-1:2018 clause 5.3.2, 5.4.10, V.1.4 and figure V.3 Blunt Test Probe SC-I23
IEC 62368-1:2018 clause 5.3.2, 5.4.10, V.1.4 and figure V.3 Blunt Test Probe SC-I23
IEC 62368-1:2018 clause 5.3.2, 5.4.10, V.1.4 and figure V.3 Blunt Test Probe SC-I23

 

 

 

 

 

 

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