Test Finger Probe B with Diameter 50 mm of IEC 60335-1 Clause 20.2 and IEC61032 SC-F2B-A
Standards & Clauses:
IEC 60335-1 clause clause 20.2.
IEC61032:1997 “Protection of persons and equipment by enclosures-Probe for verification”
IEC60529:2013 “Degrees of protection provided by enclosure (IP code)”
Samples and Restrictions:
Household appliances, electrical accessories, lamps, etc.
Application:
To verify
a) protection of persons against access to hazardous parts inside the enclosure；
b) protection of the equipment inside the enclosure against ingree of solid foreign object.
Test Principle:
The similar to test probe B of IEC 61032 but having circular stop face with a diameter of 50 mm is used to distinguish the different protection levels of the electrical enclosure. After the current or force is applied to the probe, whether the probe can contact the live parts or internal parts, to determines whether the specimen is qualified or not.
Structure:
Technical Parameters:
| Parameters /Model | SC-F2B | SC-F2B-A | SC-F2B-B
(Optional) |
SC-F2B-F
(Optional) |
| Name | Standard test finger | Circular baffle test finger | Large baffle test finger | Standard test finger with force |
| 1 | 30±0.2 | 30±0.2 | 30±0.2 | 30±0.2 |
| 2 | 60±0.2 | 60±0.2 | 60±0.2 | 60±0.2 |
| 3 | 80±0.2 | 80±0.2 | 100±0.2 | 80±0.2 |
| 4 | 180±0.2 | 180±0.2 | —- | 180±0.2 |
| 5 | R2±0.05 | R2±0.05 | R2±0.05 | R2±0.05 |
| 6 | S4±0.05 | S4±0.05 | S4±0.05 | S4±0.05 |
| 7 | 37o 0 -10’ | 37o 0 -10’ | 37o 0 -10’ | 37o 0 -10’ |
| 8 | 14 o 0 -10’ | 14 o 0 -10’ | 14 o 0 -10’ | 14 o 0 -10’ |
| 9 | Ф12 0 -0.05 | Ф12 0 -0.05 | Ф12 0 -0.05 | Ф12 0 -0.05 |
| 10 | Ф50 | Ф50 | —- | Ф50 |
| 11 | 20±0.2 | —- | —- | 20±0.2 |
| 12 | Ф75±0.2 | Ф75±0.2 | Ф125±0.2 | Ф75±0.2 |
| 13 | 5±0.5 | 5±0.5 | —- | 5±0.5 |
| 14 | —- | —- | —- | 10-50N force |
| 15 | IEC61032.1 | IEC60335-1 | IEC60335-2-14 | IEC60529
|
